10068040

Preferred Forms

200 _ | ‎‡a Osten‏ ‎‡b Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏ (sparse)
100 1 _ ‎‡a Osten, Wolfgang‏
100 1 _ ‎‡a Osten, Wolfgang‏ ‎‡d 1952-‏
100 1 _ ‎‡a Osten, Wolfgang.‏
100 0 _ ‎‡a Wolfgang Osten‏ ‎‡c German optical metrologist‏

4xx's: Alternate Name Forms (4)

5xx's: Related Names (2)

Works

Title	Sources
Adaptive optische Wellenfrontkorrektur unter Einsatz des Fresnel-Leitsterns und eines hybriden Regelkreises implementiert auf einem Field-Programmable System-on-Chip
Advanced photonic sensors and applications II : 27-30 November, 2001, Singapore
Beitrag zur modellgestützten Charakterisierung komplexer Halbleiter-Nanostrukturen mittels Weißlicht-Müller-Matrix-Fourier-Scatterometrie
Digital optics for immersive displays : 24-25 April 2018 Strasbourg, France
Digitale Verarbeitung und Auswertung von Interferenzbildern
eScience - community- und Prozess-orientierte virtuelle Wissenswelten für die Forschung Impulsreferat eScience Workshop, Stuttgart, 24. Juni 2008
Evaluation of a time-gated-single-pixel-camera as a promising sensor for autonomous vehicles in harsh weather conditions
Fringe 2005, c2006:
Fringe 2005 : the 5th International Workshop on Automatic Processing of Fringe Patterns
Fringe eighty-nine
Guang: xian jin zhi zao
Holografische Interferometrie : Grundlagen, Methoden und ihre Anwendung in der Festkörpermechanik
Interferometry eleven
Interferometry XII : applications : 4-5 August 2004, Denver, Colorado, USA
Interferometry XIII. 16-17 August, 2006, San Diego, California, USA
LAM
Laserinterferometrisches Rasterkraftmikroskop
Light: advanced manufacturing
Modaler holografischer Wellenfrontsensor für Adaptive Optik = Modal holographic wavefront sensor for adaptive optics
Opposed-view dark-field digital holographic microscopy
Optical imaging and metrology advanced technologies
Optical inspection of microsystems
Optical metrology in production engineering : 27-30 April 2004, Strasbourg, France
Optical micro- and nanometrology 5
Optische Messtechnik an den Grenzen zwischen Makro und Nano
Phase errors in high line density CGH used for aspheric testing beyond scalar approximation
Polarization scramblers with plasmonic meander-type metamaterials
Remote laboratory for digital holographic metrology
Scatter-plate microscopy with spatially coherent illumination and temporal scatter modulation
Simulation and experiment in laser metrology : proceedings of the International Symposium on Laser Applications in Precision Measurements held in Balatonfüred/Hungary, June 3-6, 1996
Simulationsgestützte Scherografie zur Defekterkennung an Kunstwerken
Untersuchungen zu 3D-Messverfahren auf der Basis von Speckle-Beleuchtung
Das verführte Auge : Wege in die 3. Dimension
Weitfeldmikroskopie unter Verwendung eines bildinvertierenden Interferometers
Zur Verbesserung der Asphärenmesstechnik mittels Computer generierten Hologrammen
光: 先进制造

Selected Co-authors

Gorecki, Christophe ‎(19)
Society of Photo-optical Instrumentation Engineers. ‎(12)
Kujawińska, Małgorzata ‎(11)
SPIE (Society) ‎(9)
Novak, Erik ‎(9)
Asundi, Anand. ‎(7)
Wernicke, Günther ‎(6)
Lehmann, Peter H. ‎(6)
Jüptner, Werner P. O. ‎(5)
European Optical Society. ‎(5)

Countries and Regions of Publication (4)

View the list below for more details.

Low

High

The flags indicate which authority file had at least some publications from the country or region:

US - United States (46)
DE - Germany (46)
FR - France (2)
CH - Switzerland (1)

Publication Statistics

Selected Publishers (11)

SPIE ‎(45)
Akademie-Verlag ‎(9)
Wiley-VCH Verlag GmbH & Co. KGaA ‎(8)
Universitätsbibliothek der Universität Stuttgart ‎(8)
VEB Fachbuchverlag ‎(5)
Taylor & Francis, CRC Press ‎(4)
Springer ‎(4)
Institut für Technische Optik, Universität Stuttgart ‎(4)
Technische Universität Dresden ‎(2)
Friedrich-Schiller-Universität Jena ‎(2)
Physik-Verl. ‎(1)

Record ID	Action	Time
BNF\|14438561	add	2009-03-03T12:03:19+00:00
LC\|n 84193891	add	2009-03-03T12:03:31+00:00
NKC\|ntk2010458273	add	2010-11-16T05:07:53+00:00
SUDOC\|067723896	add	2011-12-15T07:58:59+00:00
BIBSYS\|x99060239	delete	2012-11-27T04:00:16+00:00
ISNI\|0000000109535405	add	2013-09-16T16:15:07+00:00
DNB\|10960704X	delete	2014-10-21T12:48:43+00:00
NUKAT\|n 2005014920	add	2014-10-27T16:17:29+00:00
BIBSYS\|99060239	add	2017-04-11T20:45:43.350234+00:00
J9U\|987007433453705171	add	2020-02-02T15:49:47.861828+00:00
NLI\|004015123	delete	2020-04-12T14:32:13.914719+00:00
NII\|DA09928848	add	2020-05-10T13:20:52.390451+00:00
RERO\|vtls003660734	delete	2020-06-17T00:08:32.625309+00:00
RERO\|A003660734	add	2020-06-17T18:13:55.737608+00:00
CAOONL\|ncf12139855	add	2020-07-14T12:57:13.967562+00:00
NTA\|079601561	add	2021-01-31T04:27:22.574483+00:00
DNB\|103624623X	add	2021-07-25T05:50:48.186941+00:00
WKP\|Q116721079	add	2023-02-28T12:16:28.911961+00:00
KRNLK\|KAC2023D9712	delete	2024-07-17T11:54:16.836507+00:00

VIAF

Virtual International Authority File

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Osten, Wolfgang.

Osten, Wolfgang 1952-

Wolfgang Osten German optical metrologist

VIAF ID: 10068040 (Personal)

Permalink: http://viaf.org/viaf/10068040

Preferred Forms

4xx's: Alternate Name Forms (4)

5xx's: Related Names (2)

Works

Selected Co-authors

Countries and Regions of Publication (4)

Publication Statistics

Publication History

Identifiers

Selected Publishers (11)

About

Personal Information

Gender : Male

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External Links

Record Views

History of VIAF ID:10068040 (19)