Rome Air Development Center.
VIAF ID: 127279348 (Corporate)
Permalink: http://viaf.org/viaf/127279348
Preferred Forms
- 110 2 _ ‡a Rome Air Development Center
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- 110 2 _ ‡a Rome Air Development Center
- 110 2 _ ‡a Rome Air Development Center
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- 110 2 _ ‡a Rome Air Development Center
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4xx's: Alternate Name Forms (21)
5xx's: Related Names (7)
- 551 _ _ ‡a Griffiss Air Force Base, NY ‡4 orta ‡4 http://d-nb.info/standards/elementset/gnd#placeOfBusiness
- 510 2 _ ‡a Rome Laboratory (Griffiss Air Force Base, N.Y.)
- 551 _ _ ‡a Rome, NY ‡4 orta ‡4 http://d-nb.info/standards/elementset/gnd#placeOfBusiness
- 510 2 _ ‡a USA ‡b Air Force ‡b Rome Laboratory ‡4 nach ‡4 http://d-nb.info/standards/elementset/gnd#succeedingCorporateBody ‡e Nachfolger
- 510 2 _ ‡a USA ‡b Air Force ‡b Systems Command ‡4 adue ‡4 http://d-nb.info/standards/elementset/gnd#hierarchicalSuperiorOfTheCorporateBody ‡e Ueberordnung
- 510 2 _ ‡a United States ‡b Air Force
- 510 2 _ ‡a United States ‡b Rome Laboratory
Works
Title | Sources |
---|---|
Application of Von Neumann redundancy techniques to the reliable design of digital computers | |
Computer vision applications, meeting the challenges : 20th AIPR Workshop : 17-18 October 1991, McLean, Virginia | |
DACS annot. bibliogr., Annu. suppl. | |
The DACS annotated bibliography. a bibliography of software engineering literature. | |
Digital evaluation and failure analysis data | |
A guide for implementing total quality management : state-of-the-art report | |
Hybrid circuit data | |
Image understanding in the 90's : building systems that work : 18-19 October 1990, McLean, Virginia | |
Implementation of the MIRACODE storage-retrieval system into RADC's ... 1967: | |
Indexer consistency under minimal conditions | |
Instrumentation for predicting bearing damage | |
Knowledge-based Software Engineering Conference (6th : 1991 : Syracuse, N.Y.). Proceedings, c1991: | |
The library and information networks of the future. | |
Microcircuit device failure rates ; MDFR-0674 | |
NBS/RADC workshop, moisture measurement technology for hermetic semiconductor devices, II : proceedings of the NBS/RADC workshop held at the National Bureau of Standards, Gaithersburg, MD, November 5-7, 1980 | |
Nonelectronic parts reliability data | |
OCR and its application to documentation : a state of the art review | |
Optical signal processing for C3I, October 29-30, 1979, Boston, Massachusetts | |
Physics of failure in electronics. | |
Proceedings of the ... Antenna Applications Symposium. | |
RADC series in reliability | |
RADC-TR | |
Research directions in database security | |
Technical documentary report (Rome Air Development Center) | |
Technical note | |
Theoretical investigation of bulk semiconductor techniques for application to phased array microwave devices : 1 January 1966, 31 December, 1966 |