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The China-Japan Reliability Symposium

VIAF ID: 900146997246118890948 (Corporate)

Permalink: http://viaf.org/viaf/900146997246118890948

Preferred Forms

110 2 _ ‎‡a The China-Japan Reliability Symposium‏

Works

Title	Sources
Reliability theory and applications : proceedings of the China-Japan Reliability Symposium, September 13-25, 1987, Shanghai, Xian and Beijing, China

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