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Rasch, G. | Probabilistic Models for Some Intelligence and Attainment Tests
VIAF ID: 9477147270443635700009 ( Unknown Name Type )
Permalink: http://viaf.org/viaf/9477147270443635700009
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Rasch, G.
Language | Title | Expression | Sources |
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Japanese | 心理テストの確率モデル | 1985 |