Schmidt-Grund, Rüdiger 1976-
Rüdiger Schmidt-Grund researcher ORCID ID = 0000-0002-9655-9479
VIAF ID: 72585379 (Personal)
Permalink: http://viaf.org/viaf/72585379
Preferred Forms
4xx's: Alternate Name Forms (3)
5xx's: Related Names (5)
- 551 _ _ ‡a Ilmenau ‡4 ortw ‡4 https://d-nb.info/standards/elementset/gnd#placeOfActivity
- 551 _ _ ‡a Leipzig ‡4 ortw ‡4 https://d-nb.info/standards/elementset/gnd#placeOfActivity
- 510 2 _ ‡a Technische Universität Ilmenau ‡b Institut für Physik ‡4 affi ‡4 https://d-nb.info/standards/elementset/gnd#affiliation ‡e Affiliation
- 510 2 _ ‡a Universität Leipzig ‡4 affi ‡4 https://d-nb.info/standards/elementset/gnd#affiliation ‡e Affiliation
- 551 _ _ ‡a Wolfen ‡4 ortg ‡4 https://d-nb.info/standards/elementset/gnd#placeOfBirth
Works
Title | Sources |
---|---|
Approaches for the RCWA-based non-destructive characterization of subwavelength-structured gratings | |
Coherent polariton modes and lasing in ZnO microcavities | |
Dielectric function of ZnO and MgZnO and application to bragg reflectors and mirco-resonators | |
Impact of defects on magnetic properties of spinel zinc ferrite thin films | |
Temperature dependence of the dielectric function in the spectral range (0.5–8.5) eV of an In2O3 thin film | |
Transient birefringence and dichroism in ZnO studied with fs-time-resolved spectroscopic ellipsometry | |
Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry |