Schrimpf, Ronald Donald.
Schrimpf, Ron D.
Schrimpf, R.D.
VIAF ID: 39668708 ( Personal )
Permalink: http://viaf.org/viaf/39668708
Preferred Forms
- 200 _ | ‡a Schrimpf ‡b Ron D.
- 100 1 _ ‡a Schrimpf, R.D.
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- 100 1 _ ‡a Schrimpf, Ron D.
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- 100 1 _ ‡a Schrimpf, Ronald Donald
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4xx's: Alternate Name Forms (6)
Works
Title | Sources |
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Effets singuliers des rayonnements cosmiques et atmosphériques sur les composants mémoires. | |
Monte-Carlo simulation and contribution to understanding of Single-Event-Upset (SEU) mechanisms in CMOS technologies down to 20nm technological node | |
Prototype-device fabrication and ... 1986 | |
Radiation effects and soft errors in integrated circuits and electronic devices, c2004: | |
Single-event effects from space and atmospheric radiation in memory components | |
Soft Erreur dans les Mémoires : Nouvelles Méthodes et Pratiques pour les Tests Dynamiques et Statiques. | |
Soft Errors in Memory Devices : Novel Methods and Practices for Dynamic and Static Testing |