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Büchner, Thomas BIBSYS

VIAF ID: 3532149108691768780000 (Personal)

Permalink: http://viaf.org/viaf/3532149108691768780000

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Kostengünstige Testmethoden für Semi-Custom ASICs BIBSYS
Proceedings : 13th Annual IEEE International ASIC/SOC Conference : September 13-16, 2000, Hyatt Regency Crystal City, Arlington, VA BIBSYS

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