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Berger, Pierre-Damien, 19.. -... Sudoc [ABES], France

VIAF ID: 316671898 (Personal)

Permalink: http://viaf.org/viaf/316671898

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Application de la technique de photo réflectivité à la caractérisation de microcavités semi-conductrices = hoto-reflectance technique applied to the characterization of semiconductor microcavities Sudoc [ABES], France

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