Siegel, R. W.
Siegel, Richard W.
Siegel, R.W. (Richard W.)
VIAF ID: 278529429 ( Personal )
Permalink: http://viaf.org/viaf/278529429
Preferred Forms
- 100 1 _ ‡a Siegel, R. W.
- 100 1 _ ‡a Siegel, R. W.
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- 100 1 0 ‡a Siegel, R. W. ‡q (Richard W.)
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- 100 1 _ ‡a Siegel, Richard W.
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4xx's: Alternate Name Forms (4)
Works
Title | Sources |
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Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA | |
Electronic structure and lattice defects in alloys : proceedings of the United States-Japan Seminar on Electronic Structure and Lattice Defects in Alloys held at the East-West Center, Honolulu, 4-8 May 1987 | |
Nanophase materials : synthesis, properties, applications | |
National Science and Technology Council (NSTC), Committee on Technology (CT), Interagency Working Group on Nanoscience, Engineering and Technology (IWGN) | |
Proceedings Conference on the Utilization of Multiparameter Analyzers in Nuclear Physics : held by Columbia University at Grossinger, New York, from November 12 to November 15 1962 under the auspices of the United States Atomic Energy Commission | |
Properties of atomic defects in metals : proceedings of the International Conference on the Properties of Atomic Defects in Metals, Argonne, Illinois, USA, 18-22 October 1976 | |
WTEC panel report on: Nanostructure science and technology : R & D status and trends in nanoparticles, nanostructured materials, and nanodevices |