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Grande, Alf Peder BIBSYS

VIAF ID: 236149196257874790479 (Personal)

Permalink: http://viaf.org/viaf/236149196257874790479

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Auger depth profiling and analysis of defects in tinplate surfaces / Jan S. Johannessen, Alf P. Grande, Tor Notevarp BIBSYS
Auger elektronspektroskopi (AES) og Auger sputreprofilering (ASP) anvendt for bestemmelse av kjemisk sammensetning av YBa₂Cu₃O₇⁻δ BIBSYS
Auger sputreprofilering : en studie av sputreegenskapene hos Al-oksyd, Al, Au, Cr og Cu BIBSYS
Capping and decapping of MBE-grown GaAs(001) investigated with ASP, XPS, LEED, and RHEED BIBSYS
Piezoelektrisk plast : fysikalske egenskaper hos polyvinylidenfluorid (PVDF) / Alf Peder Grande BIBSYS
Preconditioning of c-plane sapphire for GaN molecular beam epitaxy by electron cyclotron resonance plasma nitridation BIBSYS
The role of tin in activating aluminum as an anode BIBSYS
Sluttrapport for NTNF-prosjekt 0232.6765 Piezoelektrisk plast / Alf P. Grande og Jarle Svean BIBSYS
En undersøkelse av oksyder på anodiserte NB- og ZR-prøver v. hj. a. Auger sputreprofilering BIBSYS
X-ray photoelectron spectroscopy study of thin Ag overlayers on YBa₂Cu₃O₇₋x : effects of oxygen annealing BIBSYS

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