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Lloyd, J. R. ISNI

Lloyd, James R. Sudoc [ABES], France

Lloyd, J. R. (James R.) Library of Congress/NACO NII (Japan)

VIAF ID: 21115158 (Personal)

Permalink: http://viaf.org/viaf/21115158

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Title Sources
Materials reliability issues in microelectronics, c1991: Library of Congress/NACO Sudoc [ABES], France
Proceedings of the Symposium on Electromigration of Metals and First International Symposium on Multilevel Metallization and Packaging Library of Congress/NACO Sudoc [ABES], France

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