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Cabié, Martiane 1977-... ISNI Sudoc [ABES], France

VIAF ID: 204889106 (Personal)

Permalink: http://viaf.org/viaf/204889106

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Mesures de contrainte dans les couches minces épitaxiées de semiconducteurs par la technique de la courbure adaptée à la microscopie électronique en transmission Sudoc [ABES], France
Stress measurements of thin epitaxial layers by the curvature method adapted to transmission electron microscopy (TEM). Sudoc [ABES], France

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