Sonza Reorda, Matteo
Sonza Reorda, M. (Matteo)
Sonza Reorda, M.
Reorda, M. Sonza 1961-
VIAF ID: 16612781 ( Personal )
Permalink: http://viaf.org/viaf/16612781
Preferred Forms
- 100 1 _ ‡a Reorda, M. Sonza ‡d 1961-
- 100 1 _ ‡a Sonza Reorda, M.
-
- 100 1 _ ‡a Sonza Reorda, M. ‡q (Matteo)
- 100 1 _ ‡a Sonza Reorda, Matteo
4xx's: Alternate Name Forms (7)
Works
Title | Sources |
---|---|
Amélioration de la localisation de défauts dans les circuits digitaux par diagnostic au niveau transistor | |
Analyse de robustesse de systèmes intégrés numériques | |
Conception de solutions de tolérance aux fautes à faible coût basées sur des structures approximées | |
Conception et simulation des circuits numériques en 28nm FDSOI pour la haute fiabilité | |
Design and Simulation of Digital Circuits in 28nm FDSOI for High Reliability. | |
Design of Low-Cost Fault-Tolerant Solutions based on Approximate Computing. | |
Digital IC Physical Defect Localization Improvement through Transistor Level Diagnosis. | |
Durcissement de circuits logiques reconfigurables | |
Hardening basic blocks in a mesh of clusters FPGA. | |
Improving Functional and Structural Test Solutions for Integrated Circuits. | |
Outils pour la simulation des fautes transitoires | |
Recherche opérationnelle et optimisation pour la conception testable de circuits intégrés complexes | |
Robustness analysis of digital integrated systems. | |
Signal Integrity - Aware Pattern Generation for Delay Testing. | |
Simulation tools for transient faults. | |
Software-implemented hardware fault tolerance | |
System-level test and validation of hardware/software systems, 2005: | |
Techniques de tolérance de panne pour les circuits et les systèmes. | |
Test de mémoires SRAM à faible consommation | |
Test of Low-Power SRAM Memories. | |
TEST TECHNIQUES FOR APPROXIMATE DIGITAL CIRCUITS | |
TORSIM | |
VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things : 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, Abu Dhabi, United Arab Emirates, October 23–25, 2017, Revised and Extended Selected Papers |