Ono, Kanji.
VIAF ID: 161366517 ( Personal )
Permalink: http://viaf.org/viaf/161366517
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Works
Title | Sources |
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Application of acoustic emission for structure diagnosis | |
EWGAE - Kraków 2008 : proceedings of the 28-th European Conference on Acoustic Emission Testing, [September 17-19, 2008, Kraków, Poland] |