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IEEE International Symposium on Electronic Design, Test and Applications Library and Archives Canada Library of Congress/NACO NII (Japan)

VIAF ID: 144667937 (Corporate)

Permalink: http://viaf.org/viaf/144667937

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Fourth IEEE International Symposium on Electronic Design, Test and Applications, c2008, via WWW, Sept. 8, 2010: Library and Archives Canada Library of Congress/NACO NII (Japan)

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