IEEE International Symposium on Electronic Design, Test and Applications
VIAF ID: 144667937 ( Corporate )
Permalink: http://viaf.org/viaf/144667937
Preferred Forms
4xx's: Alternate Name Forms (3)
5xx's: Related Names (1)
Works
Title | Sources |
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Fourth IEEE International Symposium on Electronic Design, Test and Applications, c2008, via WWW, Sept. 8, 2010: |