IEEE electron devices society
Institute of Electrical and Electronics Engineers (New York). Electron Devices Society
Electron Devices Society Arbeitsgemeinschaft der Institute of Electrical and Electronics Engineers
VIAF ID: 141934020 ( Corporate )
Permalink: http://viaf.org/viaf/141934020
Preferred Forms
- 110 2 _ ‡a Electron Devices Society ‡c Arbeitsgemeinschaft der Institute of Electrical and Electronics Engineers
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- 110 2 _ ‡a IEEE Electron Devices Society
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- 110 2 _ ‡a IEEE Electron Devices Society
- 110 2 _ ‡a IEEE Electron Devices Society
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- 110 2 _ ‡a IEEE Electron Devices Society
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- 110 2 _ ‡a IEEE Electron Devices Society
- 110 2 _ ‡a IEEE Electron Devices Society
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- 110 2 _ ‡a IEEE electron devices society
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4xx's: Alternate Name Forms (36)
5xx's: Related Names (9)
- 510 2 _ ‡a IEEE Electron Devices Group
- 510 2 _ ‡a IEEE Electron Devices Group.
- 510 2 _ ‡a IEEE Group on Electron Devices
- 510 2 _ ‡a Institute of Electrical and Electronics Engineers
- 510 2 _ ‡a Institute of Electrical and Electronics Engineers. ‡b Electron Devices Group
- 510 2 _ ‡a Institute of Electrical and Electronics Engineers ‡b Electron Devices Group
- 510 2 _ ‡a Institute of Electrical and Electronics Engineers ‡b Electron Devices Group ‡4 vorg ‡4 https://d-nb.info/standards/elementset/gnd#precedingCorporateBody ‡e Vorgaenger
- 510 2 _ ‡a Institute of Electrical and Electronics Engineers ‡b Group on Electron Devices
- 510 2 _ ‡a Institute of Electrical and Electronics Engineers ‡4 adue ‡4 https://d-nb.info/standards/elementset/gnd#hierarchicalSuperiorOfTheCorporateBody ‡e Ueberordnung
Works
Title | Sources |
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1990 IEEE international conference on computer-aided design | |
1999 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors : June 10-12, 1999, Karuizawa Prince Hotel, Karuizawa, Nagano, Japan | |
Advanced thermal processing of semiconductors | |
Device and materials reliability | |
Digest of technical papers. | |
EDMO | |
High performance devices | |
IEEE circuits and devices magazine. | |
IEEE conference record. | |
IEEE GaAs IC Symposium | |
IEEE Int. Reliab. Phys. Symp. proc. | |
IEEE International Electron Devices Meeting | |
IEEE trans. device mater. reliab. | |
IEEE trans. semicond. manuf. (Online) | |
IITC | |
Int. Conf. Microw. Millim. Wave Technol. proc. (Print) | |
International Conference, Indium Phosphide and Related Materials | |
International Integrated Reliability Workshop final report | |
International Interconnect Technology Conference | |
International Workshop on Numerical Modeling of Processes ... c1994: | |
ISPSD | |
IWJT | |
J-EDS | |
MCMC | |
MIEL | |
P2ID | |
Plasma- and process-induced damage | |
Proc. Bipolar/BiCMOS Circuits Technol. Meet. | |
Proc. Cust. Integr. Circuits Conf. (Online) | |
Proc. IEEE Int. Interconnect Technol. Conf. (Online) | |
Proc. Int. Symp. Phys. Fail. Analysis Integr. Circuits | |
Proc. Int. Symp. Power Semicond. Devices ICs (Online) | |
Proc.- Univ./Gov./Ind. Microelectron. Symp. (Online) | |
Proceedings. | |
Quality electronic design | |
Radio frequency integrated circuits | |
Reliability physics. | |
RFIC | |
Simulation of semiconductor processes and devices | |
SISPAD | |
T-DMR | |
Tech. dig.- IEEE Gallium Arsen. Integr. Circuit Symp. | |
Transactions on semiconductor manufacturing | |
Transducers | |
University, Government, Industry Microelectronics Symposium | |
VLSI in computers and processors | |
VLSI technology |