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IEE Measurement, Sensors, Instrumentation and NDT Professional Network NII (Japan) Library of Congress/NACO

VIAF ID: 139806600 (Corporate)

Permalink: http://viaf.org/viaf/139806600

Open Section Close Section Preferred Forms

 

 

 

 

Open Section Close Section 4xx's: Alternate Name Forms (2)

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Title Sources
The IEE Seminar and Exhibition on MEMS Sensor Technologies, 25 April 2005. Library of Congress/NACO

Open Section Close Section Selected Co-authors

Open Section Close Section Countries and Regions of Publication (1)

Open Section Close Section Publication Statistics

Open Section Close Section Selected Publishers (1)

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Open Section Close Section History of VIAF ID:139806600 (2)