Claeys, Cor L.
Claeys, C.
Claeys, Cor L., 1951-
Claeys, Cor (1951- ).
Cor L. Claeys obor působnosti: polovodiče
VIAF ID: 24781389 ( Personal )
Permalink: http://viaf.org/viaf/24781389
Preferred Forms
- 200 _ | ‡a Claeys ‡b Cor L.
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- 100 1 _ ‡a Claeys, Cor L
- 100 1 _ ‡a Claeys, Cor L.
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- 100 1 _ ‡a Claeys, Cor L.
- 100 1 _ ‡a Claeys, Cor L.
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- 100 1 _ ‡a Claeys, Cor L. ‡d 1951-
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- 100 0 _ ‡a Cor L. Claeys ‡c obor působnosti: polovodiče
4xx's: Alternate Name Forms (13)
5xx's: Related Names (2)
Works
Title | Sources |
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ALTECH 95, c1995: | |
Analytical techniques for semiconductor materials and process characterization II | |
Caractérisation électrique des propriétés d'interface dans les MOSFET nanométriques par des mesures de bruit basse fréquence | |
Cofired ceramic based electronic devices | |
Effets thermiques dans les transistors MOSFET Si avancés | |
Electrical characterization of interface properties in nano-scaled MOSFET devices based on low-frequency fluctuations. | |
ESSDERC 2004 : proceedings of the 34th European solid state device research conference [held in] Leuven, Belgium, 21-23 September , 2004 | |
Extended defects in Germanium : fundamental and technological aspects | |
GADEST '97 | |
Germanium-based technologies : from materials to devices | |
High purity silicon 8 | |
Low temperature electronics : physics, devices, circuits, and applications | |
Microelectronics technology and devices--SBMICRO 2007 | |
Noise in physical systems and 1/f fluctuations | |
Papers presented at the European Materials Research Society 1999 Spring Meeting, Symposium E: Advances in Silicon Substrates, June 1-4, 1999, Strasbourg, France | |
Proceedings of the 7th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology : GADEST '97, Spa, Belgium, October 5-10, 1997 | |
Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity, c1995: | |
Radiation effects in advanced semiconductor materials and devices | |
Random telegraph signals in semiconductor devices, 2016: | |
Thermal effects in advanced Si-MOSFETs. | |
ULSI process integration 5 | |
WOLTE 2, c1996: |