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Symposium E: Scanning Probe Microscopy for Materials Characterization BIBSYS

VIAF ID: 99149196469074791443 (Corporate)

Permalink: https://viaf.org/viaf/99149196469074791443

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International Union of Materials Research Societies - 6th International Conference in Asia (IUMRS-ICA 2000), Symposium E: Scanning Probe Microscopy for Materials Characterization, City University of Hong Kong, Hong Kong BIBSYS

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