Duparré, Angela
VIAF ID: 73497113 ( Personal )
Permalink: http://viaf.org/viaf/73497113
Preferred Forms
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- 100 1 _ ‡a Duparré, Angela
- 100 1 _ ‡a Duparré, Angela
- 100 1 _ ‡a Duparré, Angela
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Works
Title | Sources |
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Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA | |
Optical fabrication, testing, and metrology IV : 7-8 September 2011, Marseille, France | |
Optical metrology roadmap for the semiconductor, optical, and data storage industries : 30-31 July 2000, San Diego, USA |