Ehrstein, James R.
VIAF ID: 72666030 ( Personal )
Permalink: http://viaf.org/viaf/72666030
Preferred Forms
- 100 1 _ ‡a Ehrstein, James R
- 100 1 0 ‡a Ehrstein, James R.
- 100 1 _ ‡a Ehrstein, James R.
-
-
-
4xx's: Alternate Name Forms (2)
Works
Title | Sources |
---|---|
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements | |
Preparation and certification of SRM's for calibration of spreading resistance probes | |
Spreading resistance analysis for silicon layers with nonuniform resistivity | |
Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 |