VIAF

Virtual International Authority File

Search

Brzozowski, Janusz Antoni. ISNI NUKAT Center of Warsaw University Library National Library of Poland

Brzozowski, Janusz A. Library of Congress/NACO National Library of Catalonia

Brzozowski, Janusz A., 1979-... Sudoc [ABES], France ISNI

Brzozowski, J. A., 1935- Library and Archives Canada

Brzozowski, Janusz A. 1935- German National Library

Janusz Brzozowski Wikidata

VIAF ID: 72111901 (Personal)

Permalink: http://viaf.org/viaf/72111901

ISNI: 0000  0001  1670  1117 

Open Section Close Section Preferred Forms

 

 

 

 

Open Section Close Section 4xx's: Alternate Name Forms (8)

Open Section Close Section 5xx's: Related Names (2)

  • 510 2 _ ‎‡a  University of Waterloo‏ ‎‡b  Department of Computer Science‏ ‎‡e  Affiliation German National Library
  • 551 _ _ ‎‡a  Warschau German National Library

Open Section Close SectionWorks

Title Sources
Applications of automata and languages to testing Library and Archives Canada
Asynchronous circuits Library of Congress/NACO National Library of Catalonia Library and Archives Canada Sudoc [ABES], France German National Library
Component automata and RAM faults Library and Archives Canada
Developments in the theory of regular languages Library and Archives Canada
Digital networks Library of Congress/NACO Sudoc [ABES], France German National Library NUKAT Center of Warsaw University Library National Library of Catalonia National Library of Poland
An efficient algorithm for constrained encoding and its application Library and Archives Canada
Graph congruences and pair testing Library and Archives Canada
On generalized locally testable languages Library and Archives Canada
Open problems ..., 1980. Janusz Brzozowski. Library and Archives Canada
Open problems about regular languages Library and Archives Canada
Semilattices of fault semiautomata Library and Archives Canada German National Library
Terytorializacja lub funkcjonalizacja : dylematy ugrupowań integracyjnych Sudoc [ABES], France
Testability of CMOS cells Library and Archives Canada
Testing for bounded faults in RAMs Library and Archives Canada

Open Section Close Section Selected Co-authors

Open Section Close Section Countries of Publication (4)

Open Section Close Section Publication Statistics

Open Section Close Section Selected Publishers (7)

Open Section Close Section History of VIAF ID:72111901 (36)