Chin, Aland K.
VIAF ID: 6749094 ( Personal )
Permalink: http://viaf.org/viaf/6749094
Preferred Forms
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- 100 1 _ ‡a Chin, Aland K.
- 100 1 _ ‡a Chin, Aland K.
- 100 1 _ ‡a Chin, Aland K.
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Works
Title | Sources |
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Test and measurement applications of optoelectronic devices : 21-22 January, 2002, San Jose, USA |