Simoen, Eddy
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Simoen, E. (Eddy)
Simoen, Eddy 1957-
Simoen, E.
Eddy Simoen obor působnosti: polovodiče
Simoen, E. (Eddy), 1957-
Simoen, Eddy R.
VIAF ID: 67386177 (Personal)
Permalink: http://viaf.org/viaf/67386177
Preferred Forms
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100 0 _
‡a
Eddy Simoen
‡c
obor působnosti: polovodiče
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200 _ |
‡a
Simoen
‡b
Eddy
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100 1 _ ‡a Simoen, E.
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100 1 _ ‡a Simoen, E. (sparse)
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100 1 _ ‡a Simoen, E. ‡q (Eddy)
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100 1 _
‡a
Simoen, E.
‡q
(Eddy)
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100 1 _ ‡a Simoen, E. ‡q (Eddy), ‡d 1957-
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100 1 _
‡a
Simoen, Eddy
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100 1 _
‡a
Simoen, Eddy R.
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100 1 _ ‡a Simoen, Eddy ‡d (1957- ).
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100 1 _
‡a
Simoen, Eddy
‡d
1957-
4xx's: Alternate Name Forms (4)
Works
| Title | Sources |
|---|---|
| Analyse de l'augmentation et de la fluctuation discrète du courant d'obscurité des imageurs CMOS dans les environnements radiatifs spatiaux et nucléaires |
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| Analysis of the dark current increase and its fluctuations in CMOS imagers operated in space and nuclear radiative environments. |
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| CMOS past, present and future |
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| Extended defects in germanium : fundamental and technological aspects |
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| Germanium-based technologies from materials to devices |
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| High purity and high mobility semiconductors 15 |
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| Noise in physical systems and 1/f fluctuations, c1997: |
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| Radiation effects in advanced semiconductor materials and devices, 2002: |
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| Study of carrier transport phenomena and of low frequency noise as a function of the temperature in sub-10 nm FinFETs and GAA NWFETs. |
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| Study of electrical low frequency noise in advanced CMOS technologies. |
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| WOLTE 2 : proceedings of the Second European Workshop on Low Temperature Electronics : June 26-28, 1996, Leuven, Belgium |
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