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Gibbons, James F. Library of Congress/NACO Sudoc [ABES], France ISNI-test NUKAT Center of Warsaw University Library National Library of the Netherlands-test National Library of France National Diet Library, Japan

VIAF ID: 57927290 (Personal)

Permalink: http://viaf.org/viaf/57927290

ISNI-test: 0000  0001  1650  4527 

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Title Sources
CW beam processing of silicon and other semiconductors National Library of the Netherlands-test Sudoc [ABES], France National Library of France
Laser and electron-beam solid interactions and materials processing : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. National Library of the Netherlands-test Library of Congress/NACO
Projected range statistics : semiconductors and related materials NUKAT Center of Warsaw University Library Sudoc [ABES], France Library of Congress/NACO
Semiconductor electronics National Library of the Netherlands-test Sudoc [ABES], France Library of Congress/NACO
Transistors.. National Library of the Netherlands-test Sudoc [ABES], France
トランジスタと能動回路網 National Diet Library, Japan

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