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Gibbons, James F. NUKAT Center of Warsaw University Library National Library of the Netherlands-test Library of Congress/NACO National Library of France ISNI-test

VIAF ID: 57927290 (Personal)

Permalink: http://viaf.org/viaf/57927290

ISNI-test: 0000  0001  1650  4527 

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  1. Semiconductor electronics ‎(3) National Library of the Netherlands-test Library of Congress/NACO
  2. Projected range statistics : semiconductors and related materials ‎(2) NUKAT Center of Warsaw University Library Library of Congress/NACO
  3. Laser and electron-beam solid interactions and materials processing : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. ‎(2) National Library of the Netherlands-test Library of Congress/NACO
  4. CW Beam processing of Silicon and other semiconductors ‎(2) National Library of the Netherlands-test National Library of France
  5. Projected range statistics ‎(1) NUKAT Center of Warsaw University Library
  6. Measurement of the mean energy for electron-hole pair formation in silicon by low-energy electron bombardment, 1966: ‎(1) Library of Congress/NACO

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