Gibbons, James F.
VIAF ID: 57927290 (Personal)
ISNI-test: 0000 0001 1650 4527
4xx's: Alternate Name Forms (3)
- 400 1 _ ‡a Gibbons, J. F.
- 400 1 _ ‡a Gibbons, J. F. ‡q (James F.)
- 400 1 _ ‡a ギボンス, J. F
|CW beam processing of silicon and other semiconductors|
|Laser and electron-beam solid interactions and materials processing : proceedings of the Materials research society annual meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, USA|
|Measurement of the mean energy for electron-hole pair formation in silicon by low-energy electron bombardment, 1966:|
|Projected range statistics : semiconductors and related materials|
|Toranjisuta to nōdō kairomō|
Countries of Publication (3)
Selected Publishers (8)
- US - United States
- eng - English