Seiler, David G.
Seiler, D. G.
VIAF ID: 54217805 ( Personal )
Permalink: http://viaf.org/viaf/54217805
Preferred Forms
- 200 _ | ‡a Seiler ‡b David G.
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- 100 1 _ ‡a Seiler, D. G.
- 100 1 _ ‡a Seiler, David G
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- 100 1 _ ‡a Seiler, David G.
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- 100 1 _ ‡a Seiler, David G.
- 100 1 0 ‡a Seiler, David G.
4xx's: Alternate Name Forms (5)
Works
Title | Sources |
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Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New York, 11-15 May 2009 | |
Hot electrons in semiconductors : proceedings of the International Conference on Hot Electrons in Semiconductors held in Denton, Texas, 6-8 July 1977 | |
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites | |
Life on hold : finding hope in the face of serious illness | |
Narrow-gap semiconductors and related materials, c1990: | |
Proceedings of the 1990 U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Novel Infrared Detector Materials : 2-4 October 1990, San Francisco, California | |
The spectroscopy of semiconductors | |
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry |