Tsai, Benjamin K.
VIAF ID: 51517456 ( Personal )
Permalink: http://viaf.org/viaf/51517456
Preferred Forms
- 100 1 _ ‡a Tsai, Benjamin K
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- 100 1 _ ‡a Tsai, Benjamin K.
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- 100 1 _ ‡a Tsai, Benjamin K.
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- 100 1 _ ‡a Tsai, Benjamin K.
- 100 1 _ ‡a Tsai, Benjamin K.
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4xx's: Alternate Name Forms (1)
5xx's: Related Names (1)
- 510 2 _ ‡a National Institute of Standards and Technology ‡9 g:Gaithersburg, Md. ‡e Affiliation
Works
Title | Sources |
---|---|
Applications | |
Fundamentals | |
Optical modeling and measurements for solar energy systems II : 13-14 August 2008, San Diego, California, USA | |
Radiance temperature calibrations | |
Radiometric temperature measurements. | |
Spectrophotometry : accurate measurement of optical properties of materials |