Hook, Terence
VIAF ID: 48949291 ( Personal )
Permalink: http://viaf.org/viaf/48949291
Preferred Forms
- 100 1 _ ‡a Hook, Terence
- 100 1 _ ‡a Hook, Terence
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Works
Title | Sources |
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The history of Jericho Vermont : volume three 1963 - 2013 | |
P²ID | |
Plasma- and process-induced damage | |
Wafer level reliability of advanced CMOS devices and processes, 2008: |