Tanner, Brian Keith.
Tanner, B. K. (Brian Keith)
Tanner, Brian K. 1947-
Tanner, Brian K.
Brian Keith Tanner
Tanner, Brian K. (Brian Keith)
VIAF ID: 46865416 ( Personal )
Permalink: http://viaf.org/viaf/46865416
Preferred Forms
- 100 0 _ ‡a Brian Keith Tanner
- 200 _ 1 ‡a Tanner ‡b , Brian K.
- 200 _ | ‡a Tanner ‡b Brian Keith
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- 100 1 _ ‡a Tanner, B. K. ‡q (Brian Keith)
- 100 1 0 ‡a Tanner, B. K. ‡q (Brian Keith)
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- 100 1 _ ‡a Tanner, Brian K. ‡d 1947-
- 100 1 _ ‡a Tanner, Brian K. ‡d 1947-
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- 100 1 _ ‡a Tanner, Brian Keith
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4xx's: Alternate Name Forms (12)
5xx's: Related Names (6)
- 510 2 _ ‡a International Conference on Rare Earths and Actinides (1977 : Durham, England)
- 510 2 _ ‡a Nato Avanced Study Institute on characterization of crystal growth defects by X-ray methods (29-08-10-09-1979 : Durham, Eng)
- 510 2 _ ‡a North Atlantic Treaty Organization. Scientific Affairs Division
- 510 2 _ ‡a University of Durham
- 510 2 _ ‡a University of Durham ‡4 affi ‡4 https://d-nb.info/standards/elementset/gnd#affiliation ‡e Affiliation
- 510 2 _ ‡a University of Oxford
Works
Title | Sources |
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Characterization of crystal growth defects by X-ray methods | |
European Conf. on the Physics of the Rare Earths and Actinides (4th : 1982 : Durham, England). Proceedings of the Fourth European Conf. ... 1982 | |
Introduction to the physics of electrons in solids | |
Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon | |
Rare earths and actinides, 1977 : invited and contributed papers from the International conference on rare earths and actinides held in Durham, 4-6 July 1977 | |
X-Ray and neutron dynamical diffraction : theory and applications / Edited by Andre Authier, Stefano Lagomarsino and Brian K. Tanner | |
X-ray diffraction topography | |
X-ray imaging of silicon die within fully packaged semiconductor devices | |
X-ray metrology in semiconductor manufacturing |