Tsoi, Hak-Yam, 1947-
VIAF ID: 43454533 ( Personal )
Permalink: http://viaf.org/viaf/43454533
Preferred Forms
- 100 1 _ ‡a Tsoi, Hak-Yam ‡d 1947-
- 100 1 0 ‡a Tsoi, Hak-Yam, ‡d 1947-
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Works
Title | Sources |
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Mobile ion contamination of MOS structures investigated by computer-controlled laser scanning internal photoemission and self-healing breakdown techniques |