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Hill, Kennedy T. National Library of the Netherlands-test German National Library ISNI-test

Hill, Kennedy T. (Kennedy Thoen) National Library of Israel Library of Congress/NACO

VIAF ID: 36467570 (Personal)

Permalink: http://viaf.org/viaf/36467570

ISNI-test: 0000  0000  3823  1307 

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The relation of test anxiety and defensiveness to test and school performance over the elementary-school years; a further longitudinal study National Library of the Netherlands-test National Library of Israel Library of Congress/NACO

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