33166264PersonalDNB|132680440ISNI|0000000068017213WKP|Q62701500121Ritter, Martin 1970-ISNIISNI|0000000068017213DNBDNB|132680440Martin Ritter researcher in electron microscopyWKPWKP|Q62701500Martin Ritterresearcher in electron microscopyenWKPWKP|Q62701500WKP|Q62701500DNB|132680440Ritter, Martin1970-ISNIISNI|0000000068017213ISNI|0000000068017213DNB|132680440Ritter, Martin1970-DNBDNB|132680440DNB|132680440ISNI|0000000068017213WKP|Q62701500bMartin Ritterwetenschappermartin ritter wetenschapperWKPWKP|Q62701500Grabs, Schweizortghttps://d-nb.info/standards/elementset/gnd#placeOfBirthgrabs schweizDNBDNB|132680440Technische Universität Hamburg-Harburgaffihttps://d-nb.info/standards/elementset/gnd#affiliationAffiliationtechnische universitat hamburg harburgDNBDNB|132680440Technische Universität Hamburg-HarburgBetriebseinheit Elektronenmikroskopie BEEMaffihttps://d-nb.info/standards/elementset/gnd#affiliationAffiliationtechnische universitat hamburg harburg betriebseinheit elektronenmikroskopie beemDNBDNB|132680440Technische Universität Hamburgaffihttps://d-nb.info/standards/elementset/gnd#affiliationAffiliationtechnische universitat hamburgDNBDNB|132680440Technische Universität HamburgBetriebseinheit Elektronenmikroskopie BEEMaffihttps://d-nb.info/standards/elementset/gnd#affiliationAffiliationtechnische universitat hamburg betriebseinheit elektronenmikroskopie beemDNBDNB|132680440Krekeler, TobiasDNBDNB|132680440Petrov, Alexander 1978-DNBDNB|132680440Eich, ManfredDNBDNB|132680440Störmer, Michael 1962-DNBDNB|132680440Krishnamurthy, Gnanavel VaidhyanathanDNBDNB|132680440Chirumamilla, ManoharDNBDNB|132680440Schneider, Gerold A.DNBDNB|132680440Rout, Surya Snata 1984-DNBDNB|132680440Janßen, RolfDNBDNB|132680440Furlan, Kaline P.DNBDNB|132680440Berlin, Techn. UnivISNIISNI|0000000068017213Universitätsbibliothek der Technischen Universität Hamburg-HarburgDNBDNB|132680440Wirtschaftsverl. NW, Verl. für Neue Wiss.ISNIISNI|0000000068017213DNBDNB|13268044019700lived200201aaDNBDNB|132680440amDNBDNB|132680440autDNBDNB|132680440verfasserDNBDNB|1326804409783865096302DNBDNB|132680440DEDNBDNB|132680440LIDNBISNIhttp://orcid.org/0000-0002-5664-859xDNBDNB|132680440WKPWKP|Q62701500DNBDNB|132680440Alumina-doped zirconia submicro-particles : synthesis, thermal stability, and microstructural characterizationDNBDNB|132680440Dataset of ptychographic X-ray computed tomography of inverse opal photonic crystals produced by atomic layer depositionDNBDNB|132680440Defects and plasticity in ultrastrong supercrystalline nanocompositesDNBDNB|132680440Discrete element modeling and electron microscopy investigation of fatigue-induced microstructural changes in ultra-high-performance concreteDNBDNB|132680440Enhanced DySEM imaging of cantilever motion using artificial structures patterned by focused ion beam techniquesDNBDNB|132680440Highly porous α-Al 2 O 3 ceramics obtained by sintering atomic layer deposited inverse opalsDNBDNB|132680440landmark based method for the geometrical 3D calibration of scanning microscopesDNBDNB|132680440Laser-generated high entropy metallic glass nanoparticles as bifunctional electrocatalystsDNBDNB|132680440Metamaterial emitter for thermophotovoltaics stable up to 1400 °CDNBDNB|132680440Numerical study on the mechanical behavior of ultrahigh performance concrete using a three-phase discrete element modelDNBDNB|132680440Phase separation and up-hill diffusion in the ordered α2 compound of a γ-Ti-Al-Nb alloyDNBDNB|132680440Photonic materials for high-temperature applications: synthesis and characterization by X-ray ptychographic tomographyDNBDNB|132680440Porous gold with a nested-network architecture and ultrafine structureDNBDNB|132680440SiO2 core-shell submicron particlesDNBDNB|132680440Slice thickness optimization for the focused ion beam-scanning electron microscopy 3D tomography of hierarchical nanoporous goldDNBDNB|132680440Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °CDNBDNB|132680440Thermal stability of tungsten based metamaterial emitter under medium vacuum and inert gas conditionsDNBDNB|132680440Training deep neural networks to reconstruct nanoporous structures from FIB tomography images using synthetic training dataDNBDNB|132680440Unprecedented thermal stability of plasmonic titanium nitride films up to 1400 °CDNBDNB|132680440Which factor determines the optical losses in refractory tungsten thin films at high temperatures?2024-02-23T03:01:14.737181+00:00