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Bisio, Alberto Sudoc [ABES], France

VIAF ID: 316666113 (Personal)

Permalink: //viaf.org/viaf/316666113

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Title Sources
Diagnosis of Electrical Failures in Logic Systems. Sudoc [ABES], France
Diagnostic de pannes électriques dans les systèmes logiques / Youssef Ben Abboud ; sous la direction de Patrick Girard. - Thèse de doctorat : Sciences : Montpellier 2 : 2010 Sudoc [ABES], France

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