Vallet, Maxime, 1988-....
VIAF ID: 313573444 ( Personal )
Permalink: http://viaf.org/viaf/313573444
Preferred Forms
Works
Title | Sources |
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Étude des défauts bidimensionnels à base d’hélium dans le silicium - Application au transfert de films minces | |
Study of helium-based planar defects in silicon - Application to the transfer of thin films. |