Schafft, Harry A.
VIAF ID: 30828373 ( Personal )
Permalink: http://viaf.org/viaf/30828373
Preferred Forms
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- 100 1 _ ‡a Schafft, Harry A.
- 100 1 0 ‡a Schafft, Harry A.
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Works
Title | Sources |
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ARPA/NBS workshop III : test patterns for integrated circuits | |
ARPA/NBS Workshop V : moisture measurement technology for hermetic semiconductor devices : proceedings of the ARPA/NBS Workshop V, held at the National Bureau of Standards, Gaithersburg, MD, March 22-23, 1978 | |
Average power dissipated in a diode swept along its reverse characteristic | |
A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967 | |
Reliability technology for cardiac pacemakers III : a workshop report | |
Second breakdown in semiconductor devices : a bibliography | |
Stability of (thin film) solar cells and materials | |
Wire-bond electrical connections : testing, fabrication and degradation - a bibliography 1957-1971 |