Sinclair, Robert (Materials scientist)
Sinclair, Robert
VIAF ID: 109327157 ( Personal )
Permalink: http://viaf.org/viaf/109327157
Preferred Forms
4xx's: Alternate Name Forms (3)
Works
Title | Sources |
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Characterization of defects in materials, 1987: | |
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA |