Hariz, Ahsan
VIAF ID: 278421116 ( Personal )
Permalink: http://viaf.org/viaf/278421116
Preferred Forms
- 100 1 _ ‡a Hariz, Ahsan
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- 100 1 _ ‡a Hariz, Ahsan
- 100 1 0 ‡a Hariz, Ahsan
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Works
Title | Sources |
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Electrical Reliability Due to Offset Gate in Triple Polysilicon Flash EEPROM Cell | |
Smart electronics and MEMS : 11-13 December 1997, Adelaide, Australia | |
Smart materials, structures, and integrated systems, c1997: |