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Yoshizawa, Tōru, 1939- NUKAT Center of Warsaw University Library National Library of the Czech Republic Library of Congress/NACO

Yoshizawa, Tôru German National Library ISNI-test

VIAF ID: 262241570 (Personal)

Permalink: http://viaf.org/viaf/262241570

ISNI-test: 0000  0000  8222  5326 

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  1. Optomechatronic systems 3 ‎(2) Library of Congress/NACO
  2. Handbook of optical metrology : principles and applications ‎(2) NUKAT Center of Warsaw University Library Library of Congress/NACO
  3. Zenkoku daigaku shokuinroku, 1995: ‎(1) Library of Congress/NACO
  4. Two- and three-dimensional methods for inspection and metrology VI : 10-11 August 2008, San Diego, California, USA ‎(1) Library of Congress/NACO
  5. Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan ‎(1) Library of Congress/NACO
  6. Optomechatronic systems III : 12-14 November, 2002, Stuttgart, Germany ‎(1) Library of Congress/NACO
  7. Optoelectronic imaging and process technology ‎(1) Library of Congress/NACO
  8. Optoelectronic imaging and multimedia technology : 18-20 October 2010, Beijing, China ‎(1) Library of Congress/NACO
  9. Optical metrology and inspection for industrial applications : 18-20 October 2010 ‎(1) Library of Congress/NACO
  10. Optical inspection and metrology for non-optics industries : 3-4 August 2009, San Diego, California, United States ‎(1) Library of Congress/NACO

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Open Section Close Section History of VIAF ID:262241570 (5)