Seah, M.P.
Seah, Martin P.
Martin P. Seah
VIAF ID: 24674112 ( Personal )
Permalink: http://viaf.org/viaf/24674112
Preferred Forms
- 100 0 _ ‡a Martin P. Seah
- 200 _ | ‡a Seah ‡b M. P.
- 100 1 _ ‡a Seah, M. P
- 100 1 _ ‡a Seah, M. P
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- 100 1 _ ‡a Seah, M. P.
- 100 1 _ ‡a Seah, M. P.
- 100 1 0 ‡a Seah, M. P.
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4xx's: Alternate Name Forms (7)
Works
Title | Sources |
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14th International Vacuum Congress (IVC-14), 10th International Conference on Solid Surfaces (ICSS-10), 5th International Conference on Nanometre-scale Science and Technology (NANO-5), 10th International Conference on Quantitative Surface Analysis (QSA-10) : International Convention Centre, Birmingham, UK, 31 August-4 September 1998 | |
Analiz poverhnosti metodami ože-i rentgenovskoj fotoèlektronnoj spektroskopii / pod red. D. Briggsa i M. P. Siha. - Moskva, 1987. | |
Auger and X-ray photoelectron spectroscopy | |
Hyōmen bunseki. | |
IVC-14ICSS-10 : proceedings | |
Practical surface analysis. | |
表面分析. | |
表面分析:SIMS : 二次イオン質量分析法の基礎と応用 |