Schrimpf, Ronald D.
VIAF ID: 218839604 ( Personal )
Permalink: http://viaf.org/viaf/218839604
Preferred Forms
- 100 1 _ ‡a Schrimpf, Ronald D.
Works
Title | Sources |
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Monte-Carlo simulation and contribution to understanding of Single-Event-Upset (SEU) mechanisms in CMOS technologies down to 20nm technological node | |
Selected papers from the 1999 IEEE Nuclear and Space Radiation Effects Conference (NSREC'99) : Norfolk, Virginia, July 12-16, 1999 |