Lindén, Mika
VIAF ID: 213095020 (Personal)
Permalink: http://viaf.org/viaf/213095020
Preferred Forms
- 100 1 _ ‡a Linden, Mika
- 100 1 _ ‡a Lindén, Mika
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- 100 1 _ ‡a Lindén, Mika
Works
Title | Sources |
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Development of ellipsometry porosimetry for the characterization of nanoporous thin films applied to photovoltaics | |
Développement de l'ellipsométrie porosimétrie pour la caractérisation de couches minces nanoporeuses appliquées aux panneaux solaires. | |
Influence of subphase composition on the behaviour of spread, ionisable monolayers | |
Understanding in vivo degradation of mesoporous silica therapeutic vectors through in situ ellipsometry |