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Ducroquet, Frédérique Sudoc [ABES], France

VIAF ID: 188498256 (Personal)

Permalink: //viaf.org/viaf/188498256

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Caractérisation d'oxydes cristallins à haute permittivité (LaAIO3, SrTiO3) en vue d'une intégration en microélectronique igh-K crystalline dielectric (LaAlO3, SrTiO3) characterization for integration in microelectronic applications Sudoc [ABES], France
Electrical characterization of the quaternary (Ga0,47In0,53As)1-x (Al0,48In0.52 As)x (x=30%) and its application to the HFET transistor for photo-detection at 13-1.55μm. . Sudoc [ABES], France
Etude de caractérisation de matériaux diélectriques de grille à forte permittivité pour les technologies CMOS ultimes haracterisation of high permittivity gate dielectric materials for ultimate CMOS technology Sudoc [ABES], France
Etude des propriétés électroniques de couches minces de CZTSSe Sudoc [ABES], France
Etude, fabrication et propriétés de transport de transistors CMOS associant un diélectrique haute permittivité et un canal de conduction haute mobilité tudy, fabrication and transport properties of high mobility channel CMOS transistors with high-k gate dielectrics Sudoc [ABES], France
INFLUENCE DES NIVEAUX PROFONDS ET DES PHENOMENES DE SURFACE SUR LES CARACTERISTIQUES ELECTRIQUES DE PHOTODIODES GAINAS Sudoc [ABES], France
Study of electronics properties of thin films CZTSSe. Sudoc [ABES], France

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