Briggs, David, 1948-...
Briggs, D.
Briggs, D. (David), 1948-
Briggs, David 1948-.... chimiste
Briggs, David, physicien
David Briggs
Briggs, D. 1948-
Briggs, David, 29.10.1948-
Briggs, D. (David), 1948 říjen 29.-
VIAF ID: 17295705 ( Personal )
Permalink: http://viaf.org/viaf/17295705
Preferred Forms
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- 200 _ | ‡a Briggs ‡b David ‡f 1948-.... ‡c chimiste
- 100 1 _ ‡a Briggs, D.
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- 100 1 _ ‡a Briggs, D. ‡q (David), ‡d 1948-
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- 100 1 _ ‡a Briggs, David ‡d 1948-
- 100 1 _ ‡a Briggs, David ‡d 1948-... ‡c chimiste
- 100 1 _ ‡a Briggs, David, ‡d 29.10.1948-
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- 100 1 _ ‡a Briggs, David, ‡d 1948-
- 100 1 _ ‡a Briggs, David, ‡d 1948-...
- 100 0 _ ‡a David Briggs
4xx's: Alternate Name Forms (15)
5xx's: Related Names (2)
- 510 2 _ ‡a University
- 510 2 _ ‡a University of Nottingham ‡e Affiliation
Works
Title | Sources |
---|---|
Analiz poverhnosti metodami ože-i rentgenovskoj fotoèlektronnoj spektroskopii | |
ECASIA '97 : 7th European Conference on Applications of Surface and Interface Analysis : Congress Centre, Göteborg, Sweden, June 16-20, 1997 | |
Fundamentals of the physical environment | |
Handbook of static secondary ion mass spectrometry | |
High resolution XPS of organic polymers : the Scienta ESCA300 database | |
Hyōmen bunseki. | |
Industrial adhesion problems, 1985: | |
Ion and neutral spectroscopy | |
Making a difference : indicators to improve children's environmental health : summary | |
n85097232 | |
Practical surface analysis : by auger and x-ray photoelectron spectroscopy | |
Surface analysis of polymers by XPS and static SIMS | |
A survey of niobium alloys and their strengthening mechanisms | |
TOF-SIMS : materials analysis by mass spectrometry | |
表面分析. | |
表面分析:SIMS : 二次イオン質量分析法の基礎と応用 |