Barrès, Thomas, 1991-....
VIAF ID: 169152380122001761843 ( Personal )
Permalink: http://viaf.org/viaf/169152380122001761843
Preferred Forms
Works
Title | Sources |
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Caractérisation de la nano-porosité de couches minces de nitrure de silicium. Une approche multi-échelles | |
Characterization of the nano-porosity of silicon nitride thin layers. |