INSPEC (Information service)
INSPEC
Institution of Electrical Engineers. INSPEC.
Information Service for Physics, Electrotechnology and Control (Institution of Electrical Engineers)
INSPEC (Service d'information)
Institution of Electrical Engineers (London). Information Services Division
インスペック
VIAF ID: 157172367 ( Corporate )
Permalink: http://viaf.org/viaf/157172367
Preferred Forms
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- 210 | | ‡a INSPEC
- 110 2 _ ‡a INSPEC
- 110 2 _ ‡a INSPEC (Information service)
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- 110 2 _ ‡a INSPEC (Information service)
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- 110 2 _ ‡a INSPEC (Information service)
- 110 2 _ ‡a INSPEC (Information service)
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- 110 2 _ ‡a インスペック
4xx's: Alternate Name Forms (41)
5xx's: Related Names (3)
- 510 2 _ ‡a Institution of Electrical Engineers
- 510 2 _ ‡a Institution of Electrical Engineers (Londres)
- 510 2 _ ‡a Institution of engineering and technology
Works
Title | Sources |
---|---|
Advanced materials | |
Birefringence in crystals ... 1984? | |
Business automation | |
Classification : a classification scheme for the INSPEC database | |
Computer communications and storage | |
Confer alert. | |
Curr. pap. phys. | |
EEA | |
Electr. electron. abstr. | |
Electronic circuits | |
EMIS datareviews series | |
EMIS processing series | |
Human-computer interaction | |
INSPEC matters. | |
INSPEC on disc | |
INSPEC thesaurus | |
Key abstr., Antennas propag. | |
Key abstr., Comput. commun. stor. | |
Key abstr., High temp. supercond. | |
Key abstr., Power syst. appl. | |
Key abstracts. | |
List of journals and other serial sources. | |
Measurements in physics | |
Microwave technology | |
Neural networks | |
Optoelectronics | |
Phys. abstr. | |
Physical properties of liquid crystals : nematics | |
Physics briefs | |
Power systems & applications | |
Process technology for silicon carbide devices | |
Properties of amorphous silicon. | |
Properties of lattice-matched and strained indium gallium arsenide | |
Properties of lithium niobate. | |
Properties of narrow gap cadmium-based compounds | |
Properties of wide bandgap II-VI semiconductors | |
Report | |
Robotics and control | |
Semiconductor devices | |
User manual, INSPEC. |