American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics
VIAF ID: 153611556 ( Corporate )
Permalink: http://viaf.org/viaf/153611556
Preferred Forms
- 110 2 _ ‡a American Society for Testing and Materials ‡b Committee F-1 on Materials for Electron Devices and Microelectronics
- 110 2 _ ‡a American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics
- 110 2 _ ‡a American Society for Testing and Materials. ‡b Committee F-1 on Materials for Electron Devices and Microelectronics
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4xx's: Alternate Name Forms (1)
5xx's: Related Names (4)
- 510 2 _ ‡a ASTM Committee F-1 on Electronics
- 510 2 _ ‡a American Society for Testing Materials. ‡b Committee F-1 on Materials for Electron Tubes and Semiconductor Devices
- 510 2 _ ‡a American Society for Testing Materials ‡b Committee F-1 on Materials for Electron Tubes and Semiconductor Devices
- 510 2 _ ‡a American Society for Testing and Materials
Works
Title | Sources |
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Materials and electron device processing, 1961. | |
Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 |