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IEEE. Reliability Society National Library of Catalonia NUKAT Center of Warsaw University Library National Library of Australia Sudoc [ABES], France Library of Congress/NACO

VIAF ID: 132537053 (Corporate)

Permalink: http://viaf.org/viaf/132537053

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Title Sources
Device and Materials Reliability NUKAT Center of Warsaw University Library Library of Congress/NACO
IEEE Int. Intgr. Reliab. Workshop final rep. (Online) Library of Congress/NACO
IEEE Int. Reliab. Phys. Symp. proc. National Library of Catalonia Library of Congress/NACO
IEEE trans. device mater. reliab. NUKAT Center of Warsaw University Library Library of Congress/NACO
IEEE trans. semicond. manuf. (Online) Sudoc [ABES], France Library of Congress/NACO
IIRW 2005 Library of Congress/NACO
Institute of Electrical and Electronics Engineers International Integrated Reliability Workshop final report Library of Congress/NACO
IPFA 2003 Library of Congress/NACO
IRPS Library of Congress/NACO
Physical & failure analysis of integrated circuits Library of Congress/NACO
PRDC ... Library of Congress/NACO
Proc. - Pac. Rim Int. Symp. Dependable Comput. Library of Congress/NACO
Proceedings National Library of Catalonia Library of Congress/NACO
Quality Software (QSIC), 2010 10th International Conference on Library of Congress/NACO
Reliability Society newsletter. National Library of Catalonia Library of Congress/NACO
RSAMD ... Library of Congress/NACO
Secure System Integration and Reliability Improvement, SSIRI, International Conference on Library of Congress/NACO
T-DMR Library of Congress/NACO
Transactions on Reliability NUKAT Center of Warsaw University Library Library of Congress/NACO
Transactions on semiconductor manufacturing. National Library of Catalonia Sudoc [ABES], France Library of Congress/NACO
Workshop on Quantitative Software Models for reliability, complexity & cost : an assessment of the state of the art : Concord Hotel, Kiamesha Lake, N.Y., October 9-11, 1979. Library of Congress/NACO

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