IEEE Computer Society. Test Technology Committee.
VIAF ID: 125474666 ( Corporate )
Permalink: http://viaf.org/viaf/125474666
Preferred Forms
- 110 2 _ ‡a IEEE Computer Society ‡b Test Technology Committee
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- 110 2 _ ‡a IEEE Computer Society ‡b Test Technology Committee
- 110 2 _ ‡a IEEE Computer Society. Test Technology Committee
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- 110 2 _ ‡a IEEE Computer Society. ‡b Test Technology Committee
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4xx's: Alternate Name Forms (1)
5xx's: Related Names (1)
Works
Title | Sources |
---|---|
Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 | |
Dig. pap. - Int. Test Conf. | |
Digest of papers | |
Doing more with less in a rapidly changing environment | |
IEEE Test Conference | |
ITC | |
MSE | |
Proc. - IEEE Int. Conf. Microelectron. Syst. Educ. | |
Proceedings | |
Semiconductor Test Conf., Cherry Hill, N. J., 1978. LSI & boards, c1978 (a.e.) |