IEEE Computer Society. Test Technology Technical Committee
IEEE Computer Society. Technical Committee on Test Technology
VIAF ID: 151378625 (Corporate)
Permalink: http://viaf.org/viaf/151378625
Preferred Forms
- 110 2 _ ‡a IEEE Computer Society ‡b Test Technology Technical Committee
- 110 2 _ ‡a IEEE Computer Society ‡b Test Technology Technical Committee
- 110 2 _ ‡a IEEE Computer Society ‡b Test Technology Technical Committee
- 110 2 _ ‡a IEEE Computer Society. Test Technology Technical Committee
- 110 2 _ ‡a IEEE Computer Society. ‡b Technical Committee on Test Technology
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- 110 2 _ ‡a IEEE Computer Society. ‡b Test Technology Technical Committee
-
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4xx's: Alternate Name Forms (14)
5xx's: Related Names (5)
- 510 2 _ ‡a IEEE Computer Society. ‡b Technical Council on Test Technology
- 510 2 _ ‡a IEEE Computer Society ‡b Technical Council on Test Technology
- 510 2 _ ‡a IEEE Computer Society ‡b Test Technology Technical Council ‡4 nach ‡4 http://d-nb.info/standards/elementset/gnd#succeedingCorporateBody ‡e Nachfolger
- 510 2 _ ‡a IEEE Computer Society ‡4 adue ‡4 http://d-nb.info/standards/elementset/gnd#hierarchicalSuperiorOfTheCorporateBody ‡e Ueberordnung
- 510 2 _ ‡a IEEE Computer Society ‡e Ueberordnung
Works
Title | Sources |
---|---|
10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001 | |
11th Asian Test Symposium (ATS'02) : proceedings of the 11th Asian Test Symposium : 18-20 November, 2002, Guam, USA | |
ATS 2001 compendium | |
ATS'02 | |
Board and systems test track | |
Bridging faults and IDDQ testing | |
DBT | |
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA | |
Defect and fault tolerance in VLSI systems | |
DFT 2010 | |
DFT'06 | |
Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C. | |
Driving down the cost of test | |
ETW 2001 | |
IDDQ 96 | |
IEEE European Test Workshop : proceedings : 29 May-1 June, 2001, Stockholm, Sweden | |
International Test Conference (1988 : Washington, D.C.). New frontiers in testing, c1988: | |
Microelectronic Systems Education | |
MSE '05 | |
MSE'03 | |
MTDT'97 | |
Proc. IEEE VLSI Test Symp. (Online) | |
Proceedings, c1996: | |
Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA | |
Rapid System Prototyping | |
Records of the IEEE International Workshop on Memory Technology, Design and Testing | |
RSP | |
Shortening the path from specification to prototype | |
Systems education in the 21st century | |
Test and design validity | |
Third International Conference on the Economics of Design, Test, and Manufacturing : proceedings, May 16-17, 1994, Austin, Texas | |
VDSM chips and the need for defect based test | |
Very Large Scale Integration Test Symposium | |
VTS | |
VTS2009 |